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Poor Rinse – Macro Defect
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Microtronic is a leader in Semiconductor Wafer Defect Inspection, Sorting and Metrology.
Poor Rinse – Macro Defect
Poor Rinse – Macro Defect
Examples of semiconductor wafer images taken by Microtronic’s EAGLEview system that show common macro defects caused by insufficient rinse.
Download Microtronic Macro Defect Brochure
Microtronic Overview Video
Gallery of Macro Defects Detected By EAGLEview
Reticle Tilt Defect
Spin Defect – Line
Spin Defect – Entire Wafer
Spin Defect on Edge
Center Spin Macro Defect
Scratches By Machine
Scratches By Human
Rework – Yield Improvement
Rework – Scrap Avoidance
Previous Layer Defects
Partial Pattern – No Expose
Poly Haze Macro Defect
Particle Defects
Missing Patterns
Lens Stepper Macro Defects
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