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Semiconductor wafer macro defect caused by poor develop or a poor rinse during the wafer production process.
This semiconductor wafer defect occurred probably due to poor developing process, the wafer appears to have been stuck in a bath.
A dramatic example of a large macro defect caused by a develop process problem detected by EAGLEview on a semiconductor wafer.
Developer Related Defects
Developer Related Defects
Semiconductor wafer macro defect caused by poor develop or a poor rinse during the wafer production process.
This semiconductor wafer defect occurred probably due to poor developing process, the wafer appears to have been stuck in a bath.
A dramatic example of a large macro defect caused by a develop process problem detected by EAGLEview on a semiconductor wafer.
Download Microtronic Macro Defect Brochure
Microtronic Overview Video
Gallery of Macro Defects Detected By EAGLEview
Reticle Tilt Defect
Spin Defect – Line
Spin Defect – Entire Wafer
Spin Defect on Edge
Center Spin Macro Defect
Scratches By Machine
Scratches By Human
Rework – Yield Improvement
Rework – Scrap Avoidance
Previous Layer Defects
Partial Pattern – No Expose
Poly Haze Macro Defect
Particle Defects
Missing Patterns
Lens Stepper Macro Defects
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