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Occasionally half of the semiconductor wafers in a lot that are inspected are a different color. Note in the example above, the semiconductor wafers in slot 1-12 were flagged as being different from the remaining semiconductors wafers.
First 12 Wafers – Different
First 12 Wafers – Different
Occasionally half of the semiconductor wafers in a lot that are inspected are a different color. Note in the example above, the semiconductor wafers in slot 1-12 were flagged as being different from the remaining semiconductors wafers.
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Gallery of Macro Defects Detected By EAGLEview
Reticle Tilt Defect
Spin Defect – Line
Spin Defect – Entire Wafer
Spin Defect on Edge
Center Spin Macro Defect
Scratches By Machine
Scratches By Human
Rework – Yield Improvement
Rework – Scrap Avoidance
Previous Layer Defects
Partial Pattern – No Expose
Poly Haze Macro Defect
Particle Defects
Missing Patterns
Lens Stepper Macro Defects
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