EagleView easily spots reticle tilt semiconductor wafer defects which may look similar to lens wafer defects. Typically, a reticle tilt wafer macro defect goes across a stepper shot while a lens wafer macro defect tends to show a difference within the stepper shot. In this case, the center of the lens field is different than the edge of the lens field.
Reticle Tilt Defect
Reticle Tilt Defect
EagleView easily spots reticle tilt semiconductor wafer defects which may look similar to lens wafer defects. Typically, a reticle tilt wafer macro defect goes across a stepper shot while a lens wafer macro defect tends to show a difference within the stepper shot. In this case, the center of the lens field is different than the edge of the lens field.
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Gallery of Macro Defects Detected By EAGLEview
Reticle Tilt Defect
Spin Defect – Line
Spin Defect – Entire Wafer
Spin Defect on Edge
Center Spin Macro Defect
Scratches By Machine
Scratches By Human
Rework – Yield Improvement
Rework – Scrap Avoidance
Previous Layer Defects
Partial Pattern – No Expose
Poly Haze Macro Defect
Particle Defects
Missing Patterns
Lens Stepper Macro Defects
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