Errol Akomer, Former Texas Instruments Senior Technical Staff Member Joins Microtronic to Head Up Macro Engineering Applications Development
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Errol Akomer, Former Texas Instruments Senior Technical Staff Member Joins Microtronic to Head Up Macro Engineering Applications Development
Errol Akomer, Former Texas Instruments Senior Technical Staff Member Joins Microtronic to Head Up Macro Engineering Applications Development
Mr. Akomer to Assist Semiconductor Wafer Fabs in Utilizing Auto Macro Defect Inspection Technologies to Enhance Yields and Lower Costs
Hawthorne, NY May 30, 2013 – Microtronic Inc., announced today that Errol Akomer, former Texas Instruments Senior Technical Staff Member and Macro Engineering Section Manager has joined its team as Applications Director. Mr. Akomer will be responsible for developing and driving new initiatives with semiconductor wafer fabrication plants related to Microtronic’s flagship EAGLEview auto macro defect inspection system. Mr. Akomer’s responsibilities will include working directly with senior management and staff at fabrication facilities to ensure manufacturing process alignment and maximum customer ROI for all installed EAGLEview systems.
“We’re very excited that Errol Akomer has joined our team. Errol has over 25 years of semiconductor wafer inspection, production, and overall wafer manufacturing process engineering experience that will help us continue to deliver the semiconductor industry’s leading auto macro wafer inspection solutions. Errol’s unparalleled experience and unique skill set will be a valuable resource and asset to our EAGLEview customers as they continue to depend on our systems to drive more cost effective wafer production,” remarked Reiner Fenske, President Microtronic.
Mr. Akomer will be based in Dallas, Texas. He can be reached at [email protected] or 469-450-5686.
About Microtronic, Inc. is a US-based manufacturer headquartered in Hawthorne, NY that designs, manufactures and markets automated semiconductor wafer defect inspection systems, semiconductor wafer sorters, metrology and related software. Visit https://www.microtronic.com
Contact: [email protected]
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Gallery of Macro Defects Detected By EAGLEview
Reticle Tilt Defect
Spin Defect – Line
Spin Defect – Entire Wafer
Spin Defect on Edge
Center Spin Macro Defect
Scratches By Machine
Scratches By Human
Rework – Yield Improvement
Rework – Scrap Avoidance
Previous Layer Defects
Partial Pattern – No Expose
Poly Haze Macro Defect
Particle Defects
Missing Patterns
Lens Stepper Macro Defects
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