EAGLEview offers a full range of sorting options. During an inspection, EAGLEview performs OCR to read wafer scribes. After an inspection, engineers can specify sorting routines for specific levels and/or devices that occur without operator intervention. Wafer sorting flexibility includes the ability to perform typical sorting routines and advanced sorting such as placing specific wafers into specific slots. If needed, the macro inspection mode can be stopped to allow the tool to sort wafers using a “virtual tweezer” mode (i.e. click on source and destination slots to automatically move both individual and/or groups of wafers) on the tool’s user interface in one operation.
Customized Automatic Sorting
EAGLEview offers a full range of sorting options. During an inspection, EAGLEview performs OCR to read wafer scribes. After an inspection, engineers can specify sorting routines for specific levels and/or devices that occur without operator intervention. Wafer sorting flexibility includes the ability to perform typical sorting routines and advanced sorting such as placing specific wafers into specific slots. If needed, the macro inspection mode can be stopped to allow the tool to sort wafers using a “virtual tweezer” mode (i.e. click on source and destination slots to automatically move both individual and/or groups of wafers) on the tool’s user interface in one operation.
Download Microtronic Macro Defect Brochure
Microtronic Overview Video
Gallery of Macro Defects Detected By EAGLEview
Reticle Tilt Defect
Spin Defect – Line
Spin Defect – Entire Wafer
Spin Defect on Edge
Center Spin Macro Defect
Scratches By Machine
Scratches By Human
Rework – Yield Improvement
Rework – Scrap Avoidance
Previous Layer Defects
Partial Pattern – No Expose
Poly Haze Macro Defect
Particle Defects
Missing Patterns
Lens Stepper Macro Defects
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