EBR Drip Defect EBR drip, sometimes called the “eyelash” semiconductor wafer macro defect, may occur at a very...

Wafer Contamination – Small EAGLEview detects small contamination defects on the semiconductor wafer instantly. Typically, any small semiconductor...

Wafer Contamination – Large An example of a large contamination macro defect found by EAGLEview on a semiconductor...

CMP – Macro Defects Several examples of CMP related macro defects detected during an EAGLEview inspection run There...

Edge Chips – Macro Defects Above is an example of a semiconductor wafer edge chip defect detected by...

Poor Rinse – Macro Defect Semiconductor wafer with a large macro defect caused by insufficient rinse process Examples...

Blocked Etch Macro Defect Above is an example of a blocked etch macro defect identified by EAGLEview where...

Backside Contamination Semiconductor wafer images taken by EAGLEview showing macro defects caused by contamination Examples of macro defects...

2 Chamber Macro Defect Note that every other INCOMING semiconductor wafer is flagged which indicates there is a...

Arcing Defects EAGLEview image depicting arcing macro defect on a 200mm semiconductor wafer.