Above is an example of a semiconductor wafer edge chip defect detected by EAGLEview. Note that a white circle around the semiconductor wafer indicates that an edge defect may have been detected. The semiconductor wafer edge ribbon will also indicate the wafer defect location based on 360 degrees with the flat or notch at 0 degrees. EAGLEview makes it easy to visualize and clearly see where the wafer defect resides.
On the far right side of the semiconductor wafer is an edge chip defect. Microtronic’s EAGLEview system’s measuring tool indicates that this semiconductor wafer edge chip defect is about 9mm long.
Additional examples of semiconductor wafer edge chip defects detected by EAGLEview.
Edge Chips – Macro Defects
Edge Chips – Macro Defects
Above is an example of a semiconductor wafer edge chip defect detected by EAGLEview. Note that a white circle around the semiconductor wafer indicates that an edge defect may have been detected. The semiconductor wafer edge ribbon will also indicate the wafer defect location based on 360 degrees with the flat or notch at 0 degrees. EAGLEview makes it easy to visualize and clearly see where the wafer defect resides.
On the far right side of the semiconductor wafer is an edge chip defect. Microtronic’s EAGLEview system’s measuring tool indicates that this semiconductor wafer edge chip defect is about 9mm long.
Additional examples of semiconductor wafer edge chip defects detected by EAGLEview.
Download Microtronic Macro Defect Brochure
Microtronic Overview Video
Gallery of Macro Defects Detected By EAGLEview
Reticle Tilt Defect
Spin Defect – Line
Spin Defect – Entire Wafer
Spin Defect on Edge
Center Spin Macro Defect
Scratches By Machine
Scratches By Human
Rework – Yield Improvement
Rework – Scrap Avoidance
Previous Layer Defects
Partial Pattern – No Expose
Poly Haze Macro Defect
Particle Defects
Missing Patterns
Lens Stepper Macro Defects
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