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Previous Layer Defects
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Microtronic is a leader in Semiconductor Wafer Defect Inspection, Sorting and Metrology.
Previous Layer Defects
Previous Layer Defects
EAGLEview identifies wafers that require rework for yield improvement, typically used in addition to another classification such as, in this case, a scratch.
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Gallery of Macro Defects Detected By EAGLEview
Reticle Tilt Defect
Spin Defect – Line
Spin Defect – Entire Wafer
Spin Defect on Edge
Center Spin Macro Defect
Scratches By Machine
Scratches By Human
Rework – Yield Improvement
Rework – Scrap Avoidance
Previous Layer Defects
Partial Pattern – No Expose
Poly Haze Macro Defect
Particle Defects
Missing Patterns
Lens Stepper Macro Defects
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