EAGLEview identifies wafers that require rework for yield improvement, typically used in addition to another classification such as, in this case, a scratch.
An additional example of a semiconductor wafer that has a macro defect that had been detected by EAGLEview and has been also classified as needing rework for yield improvement purposes.
Rework – Yield Improvement
Rework – Yield Improvement
EAGLEview identifies wafers that require rework for yield improvement, typically used in addition to another classification such as, in this case, a scratch.
An additional example of a semiconductor wafer that has a macro defect that had been detected by EAGLEview and has been also classified as needing rework for yield improvement purposes.
Download Microtronic Macro Defect Brochure
Microtronic Overview Video
Gallery of Macro Defects Detected By EAGLEview
Reticle Tilt Defect
Spin Defect – Line
Spin Defect – Entire Wafer
Spin Defect on Edge
Center Spin Macro Defect
Scratches By Machine
Scratches By Human
Rework – Yield Improvement
Rework – Scrap Avoidance
Previous Layer Defects
Partial Pattern – No Expose
Poly Haze Macro Defect
Particle Defects
Missing Patterns
Lens Stepper Macro Defects
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