Make plans to connect with the Microtronic’s team at Semicon Europa, which is taking place November 12-15th in Munich, Germany. We will be located in a shared booth in Hall 1 (#219) with Silicon Saxony, Europe’s most successful trade association for the micro- and nanoelectronic, software, smart system and application industries.
SEMICON Europa 2024 is co-located with electronica in Munich, Germany creating the strongest single event for electronics manufacturing in Europe, and broadening the range of attendees across the electronics chain.
– Top-notch Keynotes
– Market Trends
– Exhibition
– Networking
– Advanced Packaging Forum / Fab Management Forum
– Sustainability
– Smart Manufacturing / Mobility / MedTech
– Workforce Development and many more!
Make plans to stop by and see us. If you would like to schedule a demo time, please contact us.
Join Microtronic at Semicon Europa
Make plans to connect with the Microtronic’s team at Semicon Europa, which is taking place November 12-15th in Munich, Germany. We will be located in a shared booth in Hall 1 (#219) with Silicon Saxony, Europe’s most successful trade association for the micro- and nanoelectronic, software, smart system and application industries.
SEMICON Europa 2024 is co-located with electronica in Munich, Germany creating the strongest single event for electronics manufacturing in Europe, and broadening the range of attendees across the electronics chain.
– Top-notch Keynotes
– Market Trends
– Exhibition
– Networking
– Advanced Packaging Forum / Fab Management Forum
– Sustainability
– Smart Manufacturing / Mobility / MedTech
– Workforce Development and many more!
Make plans to stop by and see us. If you would like to schedule a demo time, please contact us.
Download Microtronic Macro Defect Brochure
Microtronic Overview Video
Gallery of Macro Defects Detected By EAGLEview
Reticle Tilt Defect
Spin Defect – Line
Spin Defect – Entire Wafer
Spin Defect on Edge
Center Spin Macro Defect
Scratches By Machine
Scratches By Human
Rework – Yield Improvement
Rework – Scrap Avoidance
Previous Layer Defects
Partial Pattern – No Expose
Poly Haze Macro Defect
Particle Defects
Missing Patterns
Lens Stepper Macro Defects
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