Customized Solutions

Customized Solutions

Customized Semiconductor Wafer Inspection, Sorting & Metrology Equipment | Systems

Automated Semiconductor Wafer Testing, Defect Inspection, Sorting, and Microscope Solutions Customized to your Particular Needs

Automated Semiconductor Wafer Testing, Defect Inspection, Sorting, and Microscope Solutions

Unique Needs? Need better wafer inspection throughput, accuracy, versatility? Need a wafer defect inspection expert who’s not a sales person? We’ve been providing complete semiconductor wafer inspection, sorter, and microscopes solutions to semiconductor wafer manufacturers since 1994.

We can help.

We’ve built our name in the semiconductor wafer defect inspection and wafer testing market by working closely with our tier-1 semiconductor and fab customers around the globe. Engineer to engineer we have solved some sticky problems through the years.

We know what works and what doesn’t so if you have special requirements give us a call, and we’ll work together to build a solution that fits your particular environment.

 

Customized Semiconductor Wafer Inspection, Sorter, and Microscope Solutions for Your Particular Semiconductor Manufacturing Requirements

Let’s face it, no two semiconductor production facilities are exactly the same, and everyone has unique requirements. Microtronic prides itself not only for providing state-of-the-art semiconductor wafer inspection and sorter equipment “out-of-the-box” but also for designing and building automated wafer inspection solutions that are customized to fit your specific needs. We are semiconductor wafer defect inspection experts with decades of experience with virtually all of the components and equipment in the semiconductor equipment market, including: advanced robotics, wafer handlers, sorters, scanners, microscopes, and the application software and database programs to tie it all together in an elegant, user-focused solution.

We know what works and what doesn’t. We know the pitfalls and problems with existing solutions as semiconductor production processes and wafers become more complex and evolve. We are here to help you meet those challenges by providing customized semiconductor wafer inspection solutions that fit perfectly with your people, processes, and technology, while helping to protect your overall investment.

Customized Semiconductor Wafer Inspection, Sorter, & Imaging Technologies, Products and Applications

Microtronic Addresses The Most Demanding Semiconductor Wafer Defect Inspection Challenges

Microtronic Addresses The Most Demanding Semiconductor Wafer Defect Inspection Challenges

  • Customized Automated Macro Defect Wafer Inspection Systems from 1 to 4 cassettes. 50mm to 450mm
  • Customized configurations and integration of Microtronic ProcessGuard and SITEview Software
  • Integrated Solutions for Wafer Defect Inspection, Sorter, and Microscopes
  • Automated robotic microscope integrations for Micro and Macro Defect Wafer Inspection
  • Customized automated wafer inspection and wafer sorting systems and software
  • Advanced classification and review systems
  • Customized Robotic Microscope and Metrology Systems
  • Customized User Interfaces
  • Semiconductor wafer image creation, storage, retrieval, and analysis for your environment
  • Defect Image Database Creation, Classification, Review

Contact us today to explore Microtronic’s customized solutions for semiconductor wafer defect inspection systems.