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Microtronic is a leader in Semiconductor Wafer Defect Inspection, Sorting and Metrology.
Defect Library
Reticle Tilt Defect
Spin Defect – Line
Spin Defect – Entire Wafer
Spin Defect on Edge
Center Spin Macro Defect
Scratches By Machine
Scratches By Human
Rework – Yield Improvement
Rework – Scrap Avoidance
Previous Layer Defects
Partial Pattern – No Expose
Poly Haze Macro Defect
Particle Defects
Missing Patterns
Lens Stepper Macro Defects
Wafer Hotspot Defects
First 12 Wafers – Different
Flashfield Defects
Wafer Edge Discoloration
Developer Related Defects
EBR Drip Defect
Wafer Contamination – Small
Wafer Contamination – Large
CMP – Macro Defects
Edge Chips – Macro Defects
Poor Rinse – Macro Defect
Blocked Etch Macro Defect
Backside Contamination
2 Chamber Macro Defect
Arcing Defects
3 Chamber Macro Defect
Download Microtronic Macro Defect Brochure
Microtronic Overview Video
Gallery of Macro Defects Detected By EAGLEview
Reticle Tilt Defect
Spin Defect – Line
Spin Defect – Entire Wafer
Spin Defect on Edge
Center Spin Macro Defect
Scratches By Machine
Scratches By Human
Rework – Yield Improvement
Rework – Scrap Avoidance
Previous Layer Defects
Partial Pattern – No Expose
Poly Haze Macro Defect
Particle Defects
Missing Patterns
Lens Stepper Macro Defects
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